LCR-T3 Graphical Multi-function Tester Capacitor Inductance Resistor Transistor For Sale
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LCR-T3 Graphical Multi-function Tester Capacitor Inductance Resistor Transistor:
LCR-T3 graphic multifunction tester resistor + capacitor + diode + SCR + inductance + Transistor + mos tube
12864 liquid crystal is a liquid crystal display with backlight, backlight color is generally yellow-green.
Powering 9v battery stack. If a long power supply, you can use two 8.4v lithium battery pack consisting of.
* Added boot-voltage detection function
Automatic detection of NPN and PNP transistors, N-channel and P-channel
MOSFET, diodes (including double diodes), thyristors, transistors,
resistors and capacitors and other components,
* Automatic test the pin element and displayed on the LCD
Emitter transistor can be detected to determine the forward bias
voltage of the transistor, MOSFET protection diode amplification factor
* Measured gate threshold voltage and gate capacitance of MOSFET
* 12864 lcd display uses LCD (128 * 64 characters)
High test speed, the components validity test: 2 seconds (except in the
larger capacitors, large capacitance measurement also takes a long
time, the measurement time is 1 minute is normal)
* One button operation, start the test, get a key.
* Power consumption Off mode: less than 20 nA in
* Auto-off function, to avoid unnecessary waste, save battery power, improve battery life.
The following features for M8 and M168 Advanced Edition version differs
**** Please choose according to their needs *********
1. Using ATmega8, ATmega168 or ATmega328 microcontroller.
2.2x16-character LCD display the results.
3. One button operation, auto power off.
4. Shutdown current is only 20nA, support for battery operation.
Low-cost version without the crystal, auto power off. 1.05k version of
the software ATmega168 or ATmega328 in sleep mode when no measurement to
reduce power consumption.
6. Automatic detection of PNP and NPN bipolar transistor, N, P-channel MOSFET, JFET, diodes, dual diode, thyristor SCR.
7. Automatic detection pin layout.
8. Current amplification factor measurement bipolar transistor and the threshold voltage of the emitter junction.
9. Darlington transistor amplification factor can be identified by the high threshold voltage and high current.
10. Of the bipolar transistor, MOSFET protection diode testing.
11. Measuring the threshold voltage of the MOSFET and the gate capacitance values.
It supports two resistance measurements and symbol display, the highest
four digits and units. Both ends of the resistor symbol is shown
connected to the tester probes number (1-3). Therefore, the potential
can also be measured. If the potential adjustment to its end, the tester
can not distinguish between the middle and the ends of the pins.
13. Resistance measurement resolution is 0.1 ohms, the highest measured value 50M ohms.
It can be detected and measured a capacitor. Maximum four digits and
units. Values can be from 25pf (8MHz clock, 50pF @ 1MHz clock) to
100mF. Resolution up to 1 pF (@ 8MHz clock).
Fifteen. For more than
can 2UF value capacitor equivalent series resistance (ESR) capacitance
measurements. Resolution of 0.01 ohms and a two-digit numerical display.
This feature requires at least 16K flash ATMEGA (ATmega168 or
16. Two diodes can display symbols in the right direction. Further, the forward voltage drop displayed.
17. LED detected as a diode forward voltage drop is much higher than normal. Dual LEDs detected as double diode.
Zener diode can be detected, if the reverse breakdown voltage is less
than 4.5V. This will appear as two diodes, can only be determined by
voltage. Symbol probe around the diode is the same, in this case, you
can pass close to the threshold voltage of 700mV recognition diode anode
19. **** This annual understand, do not turn the ****
more than three diode-type parts inspection, failure to establish the
number of diode display additional messages. This will only happen if
the diode is connected to all three probes and at least one diode. In
this case, you should only connect the two probes and start the
measurement again, one by one.
20. Measuring single diode reverse
capacitance values. Bipolar transistors also can be measured, if you
connect the base and collector or emitter.
twenty one. Only one measurement to find connection full bridge.
two. Value of less than 25pf capacitor usually undetectable, but in
parallel with a diode or at least 25pf capacitor in parallel. In this
case, you have to subtract part of the shunt capacitance values.
three. Less than 2100 ohm resistor will measure inductors, if you have
at least 16K ATMEGA flash. Range from 0: 01mH than 20H, but the accuracy
is not good. Measurement results show only a single element is
twenty four. Testing time is approximately two seconds, only capacitance and inductance measurements will take a long time.
25. The software can be set to automatically turn off the power measurement times before.
Built-in self-test function and optional 50Hz clock signal frequency
accuracy check and wait for the call (ATmega168 and ATmega328).
Optional resistance and zero offset calibration of measuring equipment
output port of the self-test capability (ATmega168 and ATmega328). We
need a 100nF to 20uF capacitor connected to the compensation analog
comparator between pins 1 and 3 of the offset voltage. This can reduce
the measurement error than 40uF capacitor. Correction capacitor with the
same internal voltage reference voltage is found to internal adjustment
reference measurement ADC gain.
If the test current exceeds the
holding current, the SCR and triac it can be detected. But some current
higher than the semiconductor SCR and triac tester can provide the
trigger current. Available test current is only about 6mA! Note that all
the features of the microcontroller only has more program memory as
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