Xilinx Virtex 7 FPGA VC707 Evaluation Kit (Used, Tested Functional) For Sale
When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network.
Xilinx Virtex 7 FPGA VC707 Evaluation Kit (Used, Tested Functional):
$999.00
The Virtex-7 FPGA VC707 Evaluation Kit is a full-featured, highly-flexible, high-speed serial base platform using the Virtex-7 XC7VX485T-2FFG1761C.
Official information here: sale is for the FPGA board and power adapter only. The FPGA board has been tested using the factory image - all tests passed. The items tested are:
• UART
• LED
• IIC
• FLASH
• TIMER
• ROTARY
• SWITCH
• LCD
• DDR3
• BRAM
• BUTTON.
This is a surplus item, and thus is not covered by warranty.
No returns are accepted. All sales are final.
Delivery to United States only. No international shipping.
The test output is below:
2018-11-09 11:18:14
2018-11-09 11:18:14 Press any key to return to main menu
2018-11-09 11:18:14 Choose Feature to Test:
2018-11-09 11:18:14 1: UART Test
2018-11-09 11:18:14 2: LED Test
2018-11-09 11:18:14 3: IIC Test
2018-11-09 11:18:14 4: FLASH Test
2018-11-09 11:18:14 5: TIMER Test
2018-11-09 11:18:14 6: ROTARY Test
2018-11-09 11:18:14 7: SWITCH Test
2018-11-09 11:18:14 8: LCD Test
2018-11-09 11:18:14 9: DDR3 External Memory Test
2018-11-09 11:18:14 A: BRAM Internal Memory Test
2018-11-09 11:18:14 B: BUTTON Test
2018-11-09 11:18:14 0: Exit
2018-11-09 11:18:16 1
2018-11-09 11:18:16 VC707 - UART Test 11:18:16 Testing UART
2018-11-09 11:18:16 9600,8,N,1
2018-11-09 11:18:16 Hello world!
2018-11-09 11:18:16 UART Test Passed
2018-11-09 11:18:16
2018-11-09 11:18:16 Press any key to return to main menu
2018-11-09 11:18:18 Choose Feature to Test:
2018-11-09 11:18:18 1: UART Test
2018-11-09 11:18:18 2: LED Test
2018-11-09 11:18:18 3: IIC Test
2018-11-09 11:18:18 4: FLASH Test
2018-11-09 11:18:18 5: TIMER Test
2018-11-09 11:18:18 6: ROTARY Test
2018-11-09 11:18:18 7: SWITCH Test
2018-11-09 11:18:18 8: LCD Test
2018-11-09 11:18:18 9: DDR3 External Memory Test
2018-11-09 11:18:19 A: BRAM Internal Memory Test
2018-11-09 11:18:19 B: BUTTON Test
2018-11-09 11:18:19 0: Exit
2018-11-09 11:18:21 2
2018-11-09 11:18:22 VC707 - GPIO LED Test 11:18:22 Watch the LEDs
2018-11-09 11:18:30 Press any key to return to main menu
2018-11-09 11:18:30 Choose Feature to Test:
2018-11-09 11:18:30 1: UART Test
2018-11-09 11:18:30 2: LED Test
2018-11-09 11:18:30 3: IIC Test
2018-11-09 11:18:30 4: FLASH Test
2018-11-09 11:18:30 5: TIMER Test
2018-11-09 11:18:30 6: ROTARY Test
2018-11-09 11:18:30 7: SWITCH Test
2018-11-09 11:18:30 8: LCD Test
2018-11-09 11:18:30 9: DDR3 External Memory Test
2018-11-09 11:18:30 A: BRAM Internal Memory Test
2018-11-09 11:18:30 B: BUTTON Test
2018-11-09 11:18:30 0: Exit
2018-11-09 11:18:32 3
2018-11-09 11:18:33 VC707 - IIC EEPROM Test 11:18:33 Setup IIC Switch at address 0x74 done
2018-11-09 11:18:33 Setup IIC EEPROM device at address 0x54 done
2018-11-09 11:18:33 Writing data to eeprom at 0x80: 00 01 02 03 04 05 06 07 08 09 0A 0B 0C 0D 0E 0F
2018-11-09 11:18:33 EepromWriteData done
2018-11-09 11:18:33 Reading data from EEPROM ....EepromReadData done
2018-11-09 11:18:33 Comparing read data ....Compare done
2018-11-09 11:18:33 EepromWriteData done
2018-11-09 11:18:33 EepromReadData done
2018-11-09 11:18:33 EepromCompareData done
2018-11-09 11:18:33 Passed!
2018-11-09 11:18:33 Press any key to return to main menu
2018-11-09 11:18:35 Choose Feature to Test:
2018-11-09 11:18:35 1: UART Test
2018-11-09 11:18:35 2: LED Test
2018-11-09 11:18:35 3: IIC Test
2018-11-09 11:18:35 4: FLASH Test
2018-11-09 11:18:35 5: TIMER Test
2018-11-09 11:18:35 6: ROTARY Test
2018-11-09 11:18:35 7: SWITCH Test
2018-11-09 11:18:35 8: LCD Test
2018-11-09 11:18:35 9: DDR3 External Memory Test
2018-11-09 11:18:35 A: BRAM Internal Memory Test
2018-11-09 11:18:35 B: BUTTON Test
2018-11-09 11:18:35 0: Exit
2018-11-09 11:18:36 4
2018-11-09 11:18:36 VC707 - FLASH Test 11:18:36 -- Initialized the Flash library successfully --
2018-11-09 11:18:36 -- Locked all the blocks successfully --
2018-11-09 11:18:36 -- Erased the Flash memory contents at offset 0x3F60000 successfully --
2018-11-09 11:18:37 -- Unlocked all the blocks successfully --
2018-11-09 11:18:38 -- Writing: 11:18:38 -- Write operation at offset 0x3F60000 completed successfully --
2018-11-09 11:18:38 -- Read operation completed successfully --
2018-11-09 11:18:38 -- Data comparison successful --
2018-11-09 11:18:38 Press any key to return to main menu
2018-11-09 11:18:39 Choose Feature to Test:
2018-11-09 11:18:39 1: UART Test
2018-11-09 11:18:39 2: LED Test
2018-11-09 11:18:39 3: IIC Test
2018-11-09 11:18:40 4: FLASH Test
2018-11-09 11:18:40 5: TIMER Test
2018-11-09 11:18:40 6: ROTARY Test
2018-11-09 11:18:40 7: SWITCH Test
2018-11-09 11:18:40 8: LCD Test
2018-11-09 11:18:40 9: DDR3 External Memory Test
2018-11-09 11:18:40 A: BRAM Internal Memory Test
2018-11-09 11:18:40 B: BUTTON Test
2018-11-09 11:18:40 0: Exit
2018-11-09 11:18:40
2018-11-09 11:18:40 Press any key to return to main menu
2018-11-09 11:18:41 Choose Feature to Test:
2018-11-09 11:18:41 1: UART Test
2018-11-09 11:18:41 2: LED Test
2018-11-09 11:18:41 3: IIC Test
2018-11-09 11:18:41 4: FLASH Test
2018-11-09 11:18:41 5: TIMER Test
2018-11-09 11:18:41 6: ROTARY Test
2018-11-09 11:18:41 7: SWITCH Test
2018-11-09 11:18:41 8: LCD Test
2018-11-09 11:18:41 9: DDR3 External Memory Test
2018-11-09 11:18:41 A: BRAM Internal Memory Test
2018-11-09 11:18:41 B: BUTTON Test
2018-11-09 11:18:41 0: Exit
2018-11-09 11:18:44 5
2018-11-09 11:18:44 VC707 - Timer Test 11:18:44 Starting XPS Timer Example
2018-11-09 11:18:45 Setting up the timer counter and interrupt subsystem
2018-11-09 11:18:45 XTmrCtr_SetResetValue to 0xFFFFF000
2018-11-09 11:18:45 Starting the timer counter
2018-11-09 11:18:45 Timer counter has expired
2018-11-09 11:18:45 XTmrCtr_DisableIntr success
2018-11-09 11:18:45 Completed XPS Timer Example!
2018-11-09 11:18:45 Press any key to return to main menu
2018-11-09 11:18:46 Choose Feature to Test:
2018-11-09 11:18:46 1: UART Test
2018-11-09 11:18:46 2: LED Test
2018-11-09 11:18:46 3: IIC Test
2018-11-09 11:18:46 4: FLASH Test
2018-11-09 11:18:46 5: TIMER Test
2018-11-09 11:18:46 6: ROTARY Test
2018-11-09 11:18:46 7: SWITCH Test
2018-11-09 11:18:46 8: LCD Test
2018-11-09 11:18:46 9: DDR3 External Memory Test
2018-11-09 11:18:46 A: BRAM Internal Memory Test
2018-11-09 11:18:46 B: BUTTON Test
2018-11-09 11:18:46 0: Exit
2018-11-09 11:18:46
2018-11-09 11:18:47 Press any key to return to main menu
2018-11-09 11:18:49 Choose Feature to Test:
2018-11-09 11:18:49 1: UART Test
2018-11-09 11:18:49 2: LED Test
2018-11-09 11:18:49 3: IIC Test
2018-11-09 11:18:49 4: FLASH Test
2018-11-09 11:18:49 5: TIMER Test
2018-11-09 11:18:49 6: ROTARY Test
2018-11-09 11:18:49 7: SWITCH Test
2018-11-09 11:18:49 8: LCD Test
2018-11-09 11:18:49 9: DDR3 External Memory Test
2018-11-09 11:18:49 A: BRAM Internal Memory Test
2018-11-09 11:18:49 B: BUTTON Test
2018-11-09 11:18:49 0: Exit
2018-11-09 11:18:51 6
2018-11-09 11:18:52 VC707 - Rotary Switch Test 11:18:52 Watch the ROTARY pulses count:
2018-11-09 11:18:52 press any key to exit the test
2018-11-09 11:19:22 Press any key to return to main menu
2018-11-09 11:19:22 Choose Feature to Test:
2018-11-09 11:19:22 1: UART Test
2018-11-09 11:19:22 2: LED Test
2018-11-09 11:19:22 3: IIC Test
2018-11-09 11:19:22 4: FLASH Test
2018-11-09 11:19:22 5: TIMER Test
2018-11-09 11:19:22 6: ROTARY Test
2018-11-09 11:19:22 7: SWITCH Test
2018-11-09 11:19:22 8: LCD Test
2018-11-09 11:19:22 9: DDR3 External Memory Test
2018-11-09 11:19:22 A: BRAM Internal Memory Test
2018-11-09 11:19:22 B: BUTTON Test
2018-11-09 11:19:22 0: Exit
2018-11-09 11:19:25 7
2018-11-09 11:19:25 VC707 - GPIO Switch Test 11:19:25 Data read from GPIO Input is 0x00
2018-11-09 11:19:25 Press any key to return to main menu
2018-11-09 11:19:28 Choose Feature to Test:
2018-11-09 11:19:28 1: UART Test
2018-11-09 11:19:28 2: LED Test
2018-11-09 11:19:28 3: IIC Test
2018-11-09 11:19:28 4: FLASH Test
2018-11-09 11:19:28 5: TIMER Test
2018-11-09 11:19:28 6: ROTARY Test
2018-11-09 11:19:28 7: SWITCH Test
2018-11-09 11:19:28 8: LCD Test
2018-11-09 11:19:28 9: DDR3 External Memory Test
2018-11-09 11:19:28 A: BRAM Internal Memory Test
2018-11-09 11:19:28 B: BUTTON Test
2018-11-09 11:19:28 0: Exit
2018-11-09 11:19:28
2018-11-09 11:19:28 Press any key to return to main menu
2018-11-09 11:19:31 Choose Feature to Test:
2018-11-09 11:19:31 1: UART Test
2018-11-09 11:19:31 2: LED Test
2018-11-09 11:19:31 3: IIC Test
2018-11-09 11:19:31 4: FLASH Test
2018-11-09 11:19:31 5: TIMER Test
2018-11-09 11:19:31 6: ROTARY Test
2018-11-09 11:19:31 7: SWITCH Test
2018-11-09 11:19:31 8: LCD Test
2018-11-09 11:19:31 9: DDR3 External Memory Test
2018-11-09 11:19:31 A: BRAM Internal Memory Test
2018-11-09 11:19:31 B: BUTTON Test
2018-11-09 11:19:31 0: Exit
2018-11-09 11:19:32 7
2018-11-09 11:19:32 VC707 - GPIO Switch Test 11:19:33 Data read from GPIO Input is 0x00
2018-11-09 11:19:33 Press any key to return to main menu
2018-11-09 11:19:35 Choose Feature to Test:
2018-11-09 11:19:35 1: UART Test
2018-11-09 11:19:35 2: LED Test
2018-11-09 11:19:35 3: IIC Test
2018-11-09 11:19:35 4: FLASH Test
2018-11-09 11:19:35 5: TIMER Test
2018-11-09 11:19:35 6: ROTARY Test
2018-11-09 11:19:35 7: SWITCH Test
2018-11-09 11:19:35 8: LCD Test
2018-11-09 11:19:35 9: DDR3 External Memory Test
2018-11-09 11:19:35 A: BRAM Internal Memory Test
2018-11-09 11:19:35 B: BUTTON Test
2018-11-09 11:19:35 0: Exit
2018-11-09 11:19:35
2018-11-09 11:19:35 Press any key to return to main menu
2018-11-09 11:19:40 Choose Feature to Test:
2018-11-09 11:19:40 1: UART Test
2018-11-09 11:19:40 2: LED Test
2018-11-09 11:19:40 3: IIC Test
2018-11-09 11:19:40 4: FLASH Test
2018-11-09 11:19:40 5: TIMER Test
2018-11-09 11:19:40 6: ROTARY Test
2018-11-09 11:19:40 7: SWITCH Test
2018-11-09 11:19:40 8: LCD Test
2018-11-09 11:19:40 9: DDR3 External Memory Test
2018-11-09 11:19:40 A: BRAM Internal Memory Test
2018-11-09 11:19:40 B: BUTTON Test
2018-11-09 11:19:40 0: Exit
2018-11-09 11:19:40
2018-11-09 11:19:40 Press any key to return to main menu
2018-11-09 11:19:41 Choose Feature to Test:
2018-11-09 11:19:41 1: UART Test
2018-11-09 11:19:41 2: LED Test
2018-11-09 11:19:41 3: IIC Test
2018-11-09 11:19:41 4: FLASH Test
2018-11-09 11:19:41 5: TIMER Test
2018-11-09 11:19:41 6: ROTARY Test
2018-11-09 11:19:41 7: SWITCH Test
2018-11-09 11:19:41 8: LCD Test
2018-11-09 11:19:41 9: DDR3 External Memory Test
2018-11-09 11:19:41 A: BRAM Internal Memory Test
2018-11-09 11:19:41 B: BUTTON Test
2018-11-09 11:19:41 0: Exit
2018-11-09 11:19:43 8
2018-11-09 11:19:44 VC707 - LCD Test 11:19:44 reset LCD
2018-11-09 11:19:44 function set
2018-11-09 11:19:44 cursor mode
2018-11-09 11:19:44 entry mode
2018-11-09 11:19:44 Watch below lines on LCD
2018-11-09 11:19:44 Welcome to the
2018-11-09 11:19:44 VC707 Platform!
2018-11-09 11:19:44 Press any key to return to main menu
2018-11-09 11:20:04 Choose Feature to Test:
2018-11-09 11:20:04 1: UART Test
2018-11-09 11:20:04 2: LED Test
2018-11-09 11:20:04 3: IIC Test
2018-11-09 11:20:04 4: FLASH Test
2018-11-09 11:20:04 5: TIMER Test
2018-11-09 11:20:04 6: ROTARY Test
2018-11-09 11:20:04 7: SWITCH Test
2018-11-09 11:20:04 8: LCD Test
2018-11-09 11:20:04 9: DDR3 External Memory Test
2018-11-09 11:20:04 A: BRAM Internal Memory Test
2018-11-09 11:20:04 B: BUTTON Test
2018-11-09 11:20:04 0: Exit
2018-11-09 11:20:04
2018-11-09 11:20:04 Press any key to return to main menu
2018-11-09 11:20:12 Choose Feature to Test:
2018-11-09 11:20:12 1: UART Test
2018-11-09 11:20:12 2: LED Test
2018-11-09 11:20:12 3: IIC Test
2018-11-09 11:20:12 4: FLASH Test
2018-11-09 11:20:12 5: TIMER Test
2018-11-09 11:20:12 6: ROTARY Test
2018-11-09 11:20:12 7: SWITCH Test
2018-11-09 11:20:13 8: LCD Test
2018-11-09 11:20:13 9: DDR3 External Memory Test
2018-11-09 11:20:13 A: BRAM Internal Memory Test
2018-11-09 11:20:13 B: BUTTON Test
2018-11-09 11:20:13 0: Exit
2018-11-09 11:20:14 9
2018-11-09 11:20:14 VC707 - axi_7series_ddrx TEST 11:20:14
2018-11-09 11:20:14 V7 axi_7series_ddrx Memory Test
2018-11-09 11:20:14 Testing address range 0x80080000-0x80082000.
2018-11-09 11:20:14 Iteration 1 of 1
2018-11-09 11:20:14 Pass A) ICache: On, DCache: On
2018-11-09 11:20:14 TEST0: Write all memory to 0x00000000 and check
2018-11-09 11:20:14 Writing...
2018-11-09 11:20:14 Reading...
2018-11-09 11:20:14 Test Complete Status = SUCCESS
2018-11-09 11:20:14 TEST1: Write all memory to 0xFFFFFFFF and check
2018-11-09 11:20:14 Writing...
2018-11-09 11:20:14 Reading...
2018-11-09 11:20:14 Test Complete Status = SUCCESS
2018-11-09 11:20:14
2018-11-09 11:20:14 TEST2: Testing for stuck together bank/row/col bits
2018-11-09 11:20:14 Clearing memory to zeros...
2018-11-09 11:20:14 Writing and Reading...
2018-11-09 11:20:14 Test Complete Status = SUCCESS
2018-11-09 11:20:14
2018-11-09 11:20:14 TEST3: Testing for maximum ba/row/col noise
2018-11-09 11:20:15 This test performs 16 word writes followed by 16 word reads
2018-11-09 11:20:15 Each 64 bytes inverts the ba/row/col address
2018-11-09 11:20:15 Initializing Memory to 0xA5A5A5A5...
2018-11-09 11:20:15 Writing and Reading...
2018-11-09 11:20:15 Test Complete Status = SUCCESS
2018-11-09 11:20:15 TEST4: Testing for Inverse Data at Address
2018-11-09 11:20:15 Writing...
2018-11-09 11:20:15 Reading...
2018-11-09 11:20:15 Test Complete Status = SUCCESS
2018-11-09 11:20:15
2018-11-09 11:20:15 Number of errors in this pass = 0
2018-11-09 11:20:15
2018-11-09 11:20:15 Pass B) ICache: Off, DCache: Off
2018-11-09 11:20:15 TEST0: Write all memory to 0x00000000 and check
2018-11-09 11:20:15 Writing...
2018-11-09 11:20:15 Reading...
2018-11-09 11:20:15 Test Complete Status = SUCCESS
2018-11-09 11:20:15 TEST1: Write all memory to 0xFFFFFFFF and check
2018-11-09 11:20:15 Writing...
2018-11-09 11:20:15 Reading...
2018-11-09 11:20:15 Test Complete Status = SUCCESS
2018-11-09 11:20:15
2018-11-09 11:20:15 TEST2: Testing for stuck together bank/row/col bits
2018-11-09 11:20:15 Clearing memory to zeros...
2018-11-09 11:20:15 Writing and Reading...
2018-11-09 11:20:15 Test Complete Status = SUCCESS
2018-11-09 11:20:15
2018-11-09 11:20:15 TEST3: Testing for maximum ba/row/col noise
2018-11-09 11:20:15 This test performs 16 word writes followed by 16 word reads
2018-11-09 11:20:15 Each 64 bytes inverts the ba/row/col address
2018-11-09 11:20:16 Initializing Memory to 0xA5A5A5A5...
2018-11-09 11:20:16 Writing and Reading...
2018-11-09 11:20:16 Test Complete Status = SUCCESS
2018-11-09 11:20:16 TEST4: Testing for Inverse Data at Address
2018-11-09 11:20:16 Writing...
2018-11-09 11:20:16 Reading...
2018-11-09 11:20:16 Test Complete Status = SUCCESS
2018-11-09 11:20:16
2018-11-09 11:20:16 Number of errors in this pass = 0
2018-11-09 11:20:16
2018-11-09 11:20:16 axi_7series_ddrx test iteration #1 has PASSED!
2018-11-09 11:20:16 Total number of errors for all iterations = 0
2018-11-09 11:20:16 ### Program finished successfully ###
2018-11-09 11:20:16 Press any key to return to main menu
2018-11-09 11:20:17 Choose Feature to Test:
2018-11-09 11:20:17 1: UART Test
2018-11-09 11:20:17 2: LED Test
2018-11-09 11:20:17 3: IIC Test
2018-11-09 11:20:17 4: FLASH Test
2018-11-09 11:20:17 5: TIMER Test
2018-11-09 11:20:17 6: ROTARY Test
2018-11-09 11:20:17 7: SWITCH Test
2018-11-09 11:20:17 8: LCD Test
2018-11-09 11:20:17 9: DDR3 External Memory Test
2018-11-09 11:20:17 A: BRAM Internal Memory Test
2018-11-09 11:20:17 B: BUTTON Test
2018-11-09 11:20:17 0: Exit
2018-11-09 11:20:17
2018-11-09 11:20:18 Press any key to return to main menu
2018-11-09 11:20:21 Choose Feature to Test:
2018-11-09 11:20:21 1: UART Test
2018-11-09 11:20:21 2: LED Test
2018-11-09 11:20:21 3: IIC Test
2018-11-09 11:20:21 4: FLASH Test
2018-11-09 11:20:21 5: TIMER Test
2018-11-09 11:20:21 6: ROTARY Test
2018-11-09 11:20:21 7: SWITCH Test
2018-11-09 11:20:21 8: LCD Test
2018-11-09 11:20:21 9: DDR3 External Memory Test
2018-11-09 11:20:21 A: BRAM Internal Memory Test
2018-11-09 11:20:21 B: BUTTON Test
2018-11-09 11:20:21 0: Exit
2018-11-09 11:20:22 A
2018-11-09 11:20:23 VC707 - AXI BRAM TEST 11:20:23
2018-11-09 11:20:23 V7 AXI BRAM Memory Test
2018-11-09 11:20:23 Testing address range 0xC0030000-0xC00FFFFF.
2018-11-09 11:20:23 Iteration 1 of 1
2018-11-09 11:20:23 Pass A) ICache: On, DCache: On
2018-11-09 11:20:23 TEST0: Write all memory to 0x00000000 and check
2018-11-09 11:20:23 Writing...
2018-11-09 11:20:23 Reading...
2018-11-09 11:20:23 Test Complete Status = SUCCESS
2018-11-09 11:20:23 TEST1: Write all memory to 0xFFFFFFFF and check
2018-11-09 11:20:23 Writing...
2018-11-09 11:20:23 Reading...
2018-11-09 11:20:23 Test Complete Status = SUCCESS
2018-11-09 11:20:23
2018-11-09 11:20:23 TEST2: Testing for stuck together bank/row/col bits
2018-11-09 11:20:23 Clearing memory to zeros...
2018-11-09 11:20:23 Writing and Reading...
2018-11-09 11:20:23 Test Complete Status = SUCCESS
2018-11-09 11:20:23
2018-11-09 11:20:23 TEST4: Testing for Inverse Data at Address
2018-11-09 11:20:23 Writing...
2018-11-09 11:20:23 Reading...
2018-11-09 11:20:23 Test Complete Status = SUCCESS
2018-11-09 11:20:23
2018-11-09 11:20:23 Number of errors in this pass = 0
2018-11-09 11:20:23
2018-11-09 11:20:24 Pass B) ICache: Off, DCache: Off
2018-11-09 11:20:24 TEST0: Write all memory to 0x00000000 and check
2018-11-09 11:20:24 Writing...
2018-11-09 11:20:24 Reading...
2018-11-09 11:20:24 Test Complete Status = SUCCESS
2018-11-09 11:20:24 TEST1: Write all memory to 0xFFFFFFFF and check
2018-11-09 11:20:25 Writing...
2018-11-09 11:20:25 Reading...
2018-11-09 11:20:25 Test Complete Status = SUCCESS
2018-11-09 11:20:25
2018-11-09 11:20:25 TEST2: Testing for stuck together bank/row/col bits
2018-11-09 11:20:25 Clearing memory to zeros...
2018-11-09 11:20:25 Writing and Reading...
2018-11-09 11:20:25 Test Complete Status = SUCCESS
2018-11-09 11:20:25
2018-11-09 11:20:25 TEST4: Testing for Inverse Data at Address
2018-11-09 11:20:26 Writing...
2018-11-09 11:20:26 Reading...
2018-11-09 11:20:26 Test Complete Status = SUCCESS
2018-11-09 11:20:26
2018-11-09 11:20:26 Number of errors in this pass = 0
2018-11-09 11:20:26
2018-11-09 11:20:26 AXI BRAM test iteration #1 has PASSED!
2018-11-09 11:20:26 Total number of errors for all iterations = 0
2018-11-09 11:20:26 ### Program finished successfully ###
2018-11-09 11:20:26 Press any key to return to main menu
2018-11-09 11:20:27 Choose Feature to Test:
2018-11-09 11:20:28 1: UART Test
2018-11-09 11:20:28 2: LED Test
2018-11-09 11:20:28 3: IIC Test
2018-11-09 11:20:28 4: FLASH Test
2018-11-09 11:20:28 5: TIMER Test
2018-11-09 11:20:28 6: ROTARY Test
2018-11-09 11:20:28 7: SWITCH Test
2018-11-09 11:20:28 8: LCD Test
2018-11-09 11:20:28 9: DDR3 External Memory Test
2018-11-09 11:20:28 A: BRAM Internal Memory Test
2018-11-09 11:20:28 B: BUTTON Test
2018-11-09 11:20:28 0: Exit
2018-11-09 11:20:28
2018-11-09 11:20:28 Press any key to return to main menu
2018-11-09 11:20:31 Choose Feature to Test:
2018-11-09 11:20:31 1: UART Test
2018-11-09 11:20:31 2: LED Test
2018-11-09 11:20:31 3: IIC Test
2018-11-09 11:20:31 4: FLASH Test
2018-11-09 11:20:31 5: TIMER Test
2018-11-09 11:20:31 6: ROTARY Test
2018-11-09 11:20:31 7: SWITCH Test
2018-11-09 11:20:31 8: LCD Test
2018-11-09 11:20:31 9: DDR3 External Memory Test
2018-11-09 11:20:31 A: BRAM Internal Memory Test
2018-11-09 11:20:31 B: BUTTON Test
2018-11-09 11:20:31 0: Exit
Related Items:
Case Of 60 XILINX XCV1000-4BG560C0786 Xilinx FPGA Virtex Family Sealed Case
$599.99
XMF4 XILINX VIRTEX-4 FPGA MODULE
$110.00
XILINK VIRTEX UltraScale+ XCVU37P FSVH2892AAZ
$1200.00
